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Epitaxial growth of multiferroic BiFeO3 thin films with (101) and (111) orientations on (100) Si substrates
| Content Provider | Semantic Scholar |
|---|---|
| Author | Choi, Bum Ho Hesse, Dietrich |
| Copyright Year | 2013 |
| Abstract | Multiferroic (101)- and (111)-oriented BiFeO3 thin films were grown on heteroepitaxial substrates of (110) SrRuO3/(100) YSZ/(100) Si and (111) SrRuO3/(111) Pt/(100) YSZ/(100) Si, respectively, by pulsed laser deposition. X-ray diffraction θ–2θ scans, ϕ scans, and pole figures showed the well-developed out-of-plane and in-plane orientations of the epitaxial BiFeO3 films. The (111) BiFeO3 films showed ∼3/2 times higher remanent polarization (58.9 μC/cm2) than that of the (101) BiFeO3 films (44.3 μC/cm2), thus revealing the ferroelectric anisotropy. The (101) BiFeO3 films exhibited a good fatigue resistance up to 4.6 × 107 cycles, whereas the (111) BiFeO3 films proved to be vulnerable to fatigue, which is associated with the polarization switching path. |
| Starting Page | 242906 |
| Ending Page | 242906 |
| Page Count | 1 |
| File Format | PDF HTM / HTML |
| DOI | 10.1063/1.4811484 |
| Alternate Webpage(s) | http://www-old.mpi-halle.mpg.de/mpi/publi/pdf/11297_13.pdf |
| Alternate Webpage(s) | https://doi.org/10.1063/1.4811484 |
| Volume Number | 102 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
