Magnetic force microscopy of single-domain cobalt dots patterned using interference lithography

Content Provider	Semantic Scholar
Author	Fernández, Asunción Bedrossian, Peter J. Baker, Sherry L. Vernon, S. Pankratz Kania, Don R.
Copyright Year	1996
Abstract	We have fabricated arrays of Co dots having diameters of 100 nm and 70 nm using interference lithography. The density of these arrays is 7.2/spl times/10/sup 9//in/sup 2/. Magnetic force microscopy measurements indicate that the Co dots are single-domain with moments that can be controlled to point either in-plane or out-of-plane. Interference lithography is a process that is easily scaled to large areas and is potentially capable of high throughput. Large, uniform arrays of single-domain structures are potentially useful for high-density, low-noise data storage.
Starting Page	4472
Ending Page	4474
Page Count	3
File Format	PDF HTM / HTML
DOI	10.1109/20.538901
Volume Number	32
Alternate Webpage(s)	https://digital.library.unt.edu/ark:/67531/metadc684561/m2/1/high_res_d/368285.pdf
Alternate Webpage(s)	https://doi.org/10.1109/20.538901
Language	English
Access Restriction	Open
Content Type	Text
Resource Type	Article