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Model DC tranzystora GaN HEMT z uwzględnieniem parametrów fizycznych
| Content Provider | Semantic Scholar |
|---|---|
| Author | Wojtasiak, Wojciech Kuchta, Dawid |
| Copyright Year | 2015 |
| Abstract | Commonly known method for the measurement of electron mobility and concentration in the 2-dimensional electron gas (2-DEG) of HEMT heterostructures are used to evaluate the individual stages in the technological process. Currently, there is no quantitative reference of values obtained with the use of mentioned methods directly to the electrical characteristics of the transistor. This was the main reason to apply a terminal approach in order to determine a mobility and carrier concentration in 2-DEG of GaN HEMTs heterostructures based on physical relationships and IV characteristics. (A DC Analytical Model of AlGaN/GaN HEMT including physical parameters). Słowa kluczowe: model, GaN HEMT, tranzystor, ruchliwość, koncentracja, 2-DEG, C-V. |
| Starting Page | 207 |
| Ending Page | 210 |
| Page Count | 4 |
| File Format | PDF HTM / HTML |
| DOI | 10.15199/48.2015.09.54 |
| Alternate Webpage(s) | http://pe.org.pl/articles/2015/9/54.pdf |
| Alternate Webpage(s) | https://doi.org/10.15199/48.2015.09.54 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |