NDLI: Determination of Soft X-ray Emission Spectroscopy Parameters using Experimental Data for Quantitative Microanalysis

Please wait, while we are loading the content...

Determination of Soft X-ray Emission Spectroscopy Parameters using Experimental Data for Quantitative Microanalysis

Content Provider	Semantic Scholar
Author	Demers, Hendrix Macrae, Colin M. Wilson, Nicholas Charles Hovington, Pierre Timoshevskii, Vladimir Gauvin, Raynald Zaghib, Karim
Copyright Year	2016
Abstract	Recent development in x-ray detection technology like the windowless energy dispersive spectrometer silicon drift detector (EDS SDD) [1] and the soft x-ray emission spectrometer (SXES) [2] allow the measurement of soft x-ray lines (> 50 eV). However, the conventional microanalysis models are not well tested for these soft x-ray lines. Furthermore, chemical bounding can affect the x-ray emission [3], which are not currently taken into account with the conventional models. The relationship between emitted xray intensity and accelerating voltage was noted by Andersen (1967) and Kyser (1971) use it to experimentally measured mass absorption coefficients (MACs). In this work, soft x-ray emission parameters like the MAC are determined by comparing experimental measurements and Monte Carlo simulations [4] using the emitted x-ray intensity and accelerating voltage relationship.
File Format	PDF HTM / HTML
Alternate Webpage(s)	http://journals.cambridge.org/fulltext_content/supplementary/MAM22_S3_minisite/7337/0408.pdf
Language	English
Access Restriction	Open
Subject Keyword	Coefficient Computed Tomography Scanning Systems Detectors Diagnostic radiologic examination Dispersive partial differential equation Dual-Energy X-Ray Absorptiometry Ehlers-Danlos Syndrome Energy Dispersive Spectrometer Experiment Extended Data Services Leucaena pulverulenta Mass Effect Trilogy Monte Carlo method Roentgen Rays Silicon Simulation Spectrometers Tomography, Emission-Computed Views:Finding:Point in time:To be specified in another part of the message:Narrative:XR voltage
Content Type	Text
Resource Type	Article

Central Library (ISO-9001:2015 Certified)
Indian Institute of Technology Kharagpur
Kharagpur, West Bengal, India | PIN - 721302

See location in the Map
03222 282435
Mail: support@ndl.gov.in

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in