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Efficient Improvement of Hot-Carrier-Induced Degradation for Sub-0.1μm CMOSFET
Content Provider | Semantic Scholar |
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Author | Lai, Chieh-Ming Hu, Chia-Che Lin, Jung-Chun Pan, Shing-Tai Yeh, Wen-Kuan |
Copyright Year | 2003 |
Abstract | 1. Institute of Microelectronics, National Cheng Kung University, Taiwan. 2. Department of Computer Science Information Engineering, Shu-Te University, Taiwan. 3. Department of Electrical Engineering, National Chiao-Tung University, Taiwan. 4. Department of Electrical Engineering, National University of Kaohsiung, Taiwan No. 700, Kaohsiung University Rd., Nan-Tzu. Dist. 811, Kaohsiung, Taiwan. Tel: 886-7-5919372, Fax: 886-7-5919374, E-mail: wkyeh@nuk.edu.tw |
File Format | PDF HTM / HTML |
DOI | 10.7567/SSDM.2003.P2-1 |
Alternate Webpage(s) | https://confit.atlas.jp/guide/event-img/ssdm2003/P2-1/public/pdf_archive?type=in |
Alternate Webpage(s) | https://doi.org/10.7567/SSDM.2003.P2-1 |
Language | English |
Access Restriction | Open |
Content Type | Text |
Resource Type | Article |