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ZnO-based transparent thin-film transistors
| Content Provider | Semantic Scholar |
|---|---|
| Author | Hoffman, Randall L. Norris, Brian J. Wagera, J. F. |
| Copyright Year | 2003 |
| Abstract | Highly transparent ZnO-based thin-film transistors ~TFTs! are fabricated with optical transmission ~including substrate ! of ;75% in the visible portion of the electromagnetic spectrum. Current– voltage measurements indicate n-channel, enhancement-mode TFT operation with excellent drain current saturation and a drain current on-to-off ratio of ;10. Threshold voltages and channel mobilities of devices fabricated to date range from ;10 to 20 V and;0.3 to 2.5 cm/V s, respectively. Exposure to ambient light has little to no observable effect on the drain current. In contrast, exposure to intense ultraviolet radiation results in persistent photoconductivity, associated with the creation of electron-hole pairs by ultraviolet photons with energies greater than the ZnO band gap. Light sensitivity is reduced by decreasing the ZnO channel layer thickness. One attractive application for transparent TFTs involves their use as select-transistors in each pixel of an active-matrix liquid-crystal display. ©2003 American Institute of Physics. @DOI: 10.1063/1.1542677 # |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://ir.library.oregonstate.edu/xmlui/bitstream/handle/1957/14182/Wager.ZnO-basedTransparentThin-filmTransistors.pdf?sequence=3 |
| Alternate Webpage(s) | http://eecs.oregonstate.edu/matdev/pub/ZnO_TTFT_Hoffman.pdf |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | Active matrix Active-matrix liquid-crystal display Electromagnetic Spectrum Electron hole Energy, Physics Immunoglobulin lambda-Chains Observable Photons Pixel Thickness (graph theory) Thin-film transistor Thin-film-transistor liquid-crystal display Ultraviolet Rays Zinc Oxide |
| Content Type | Text |
| Resource Type | Article |
