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Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations
| Content Provider | Semantic Scholar |
|---|---|
| Author | Garg, Rajesh Khatri, Sunil P. |
| Copyright Year | 2009 |
| Abstract | This book describes the design of resilient VLSI circuits. VLSI design has become more challenging recently, due to the detrimental effects of radiation particle strikes and processing variations. This book presents algorithms to analyze the effects of these issues on the electrical behavior of VLSI circuits and circuit design techniques to mitigate the impact of these problems. |
| Starting Page | 212 |
| Ending Page | 212 |
| Page Count | 1 |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://joburg.store/analysis/and/analysis_and_design_of_resilient_vlsi_circuits_mitigating_soft_errors_and_process_variations.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
