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Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation
| Content Provider | Semantic Scholar |
|---|---|
| Author | Ziegler, Mathias Tomm, Jens W. Reeber, David Elsaesser, Thomas Zeimer, Ute Larsen, Henning Engelbrecht Petersen, Paul Andersen, Peter E. |
| Copyright Year | 2009 |
| Abstract | Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in single-pulse operation in order to separate facet degradation from subsequent degradation processes. During each pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 μs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The single-pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD. |
| Starting Page | 191101 |
| Ending Page | 191101 |
| Page Count | 1 |
| File Format | PDF HTM / HTML |
| DOI | 10.1063/1.3133339 |
| Volume Number | 94 |
| Alternate Webpage(s) | http://orbit.dtu.dk/files/4847910/Ziegler.pdf |
| Alternate Webpage(s) | https://doi.org/10.1063/1.3133339 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
