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Will Future Measurement Needs of the Semiconductor Industry Be Met?
| Content Provider | Semantic Scholar |
|---|---|
| Author | Bennett, Herbert S. |
| Copyright Year | 2007 |
| Abstract | We discuss the ability of the nation's measurement system to meet future metrology needs of the semiconductor industry. Lacking an acceptable metric for assessing the health of metrology for the semiconductor industry, we identify a limited set of unmet measurement needs. Assuming that this set of needs may serve as proxy for the galaxy of semiconductor measurement needs, we examine it from the perspective of what will be required to continue the semiconductor industry's powerful impact in the world's macro-economy and maintain its exceptional record of numerous technological innovations. This paper concludes with suggestions about ways to strengthen the measurement system for the semiconductor industry. |
| Starting Page | 25 |
| Ending Page | 38 |
| Page Count | 14 |
| File Format | PDF HTM / HTML |
| DOI | 10.6028/jres.112.002 |
| PubMed reference number | 27110452 |
| Journal | Medline |
| Volume Number | 112 |
| Journal | Journal of research of the National Institute of Standards and Technology |
| Alternate Webpage(s) | http://nvlpubs.nist.gov/nistpubs/jres/112/1/V112.N01.A02.pdf |
| Alternate Webpage(s) | https://doi.org/10.6028/jres.112.002 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
