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Measurement of lateral charge diffusion in thick, fully depleted, back-illuminated CCDs
| Content Provider | Semantic Scholar |
|---|---|
| Author | Karcher, Armin Bebek, C. Kolbe, W. Maurath, Dominic Prasad, V. Uslenghi, Michela C. Wagner, Michaela |
| Copyright Year | 2003 |
| Abstract | Lateral charge diffusion in back-illuminated CCDs directly affects the point spread function (PSF) and spatial resolution of an imaging device. This can be of particular concern in thick, back-illuminated CCDs. We describe a technique of measuring this diffusion and present PSF measurements for an 800/spl times/1100, 15 /spl mu/m pixel, 280 /spl mu/m thick, back-illuminated, p-channel CCD that can be over-depleted. The PSF is measured over a wavelength range of 450 nm to 650 nm and at substrate bias voltages between 6 V and 80 V. |
| Starting Page | 107 |
| Ending Page | 112 |
| Page Count | 6 |
| File Format | PDF HTM / HTML |
| DOI | 10.1109/TNS.2004.834721 |
| Volume Number | 3 |
| Alternate Webpage(s) | https://digital.library.unt.edu/ark:/67531/metadc780433/m2/1/high_res_d/836977.pdf |
| Alternate Webpage(s) | https://cloudfront.escholarship.org/dist/prd/content/qt2pp8s12h/qt2pp8s12h.pdf?t=lnq0hf |
| Alternate Webpage(s) | https://doi.org/10.1109/TNS.2004.834721 |
| Journal | 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
