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Origin of electric field enhancement in field emission from amorphous carbon thin films
| Content Provider | Semantic Scholar |
|---|---|
| Author | Carey, J. David Forrest, R. D. Silva, S. R. P. |
| Copyright Year | 2001 |
| Abstract | The observation of electron emission from amorphous carbon thin films at low applied electric fields is explained in terms of an enhancement of the field brought about by dielectric inhomogeneities within the film. These inhomogeneities originate from the differences between conductive, spatially localized sp2 C clusters surrounded by a more insulating sp3 matrix. By a more complete understanding of the concentration and distribution of the clusters, a generic model for field emission from amorphous carbon thin films can be developed. Extensions of this model to explain the emission properties of carbon nanotubes and carbon nanocomposite materials are also presented. |
| Starting Page | 2339 |
| Ending Page | 2341 |
| Page Count | 3 |
| File Format | PDF HTM / HTML |
| DOI | 10.1063/1.1366369 |
| Volume Number | 78 |
| Alternate Webpage(s) | http://epubs.surrey.ac.uk/742165/3/APL%2078%20ii.pdf |
| Alternate Webpage(s) | http://epubs.surrey.ac.uk/1243/1/fulltext.pdf |
| Alternate Webpage(s) | https://doi.org/10.1063/1.1366369 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
