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Towards sub-100-nm X-ray microscopy for tomographic applications
| Content Provider | Semantic Scholar |
|---|---|
| Author | Bruyndonckx, Peter Sasov, Alexander Pauwels, Bart |
| Copyright Year | 2009 |
| Abstract | We have demonstrated that structures down to 150 nm can be visualized in X-ray projection images using nanofocus X-ray sources. Due to their unlimited depth of focus, they do not possess a limit on the specimen size. This is essential for three-dimensional tomographic imaging of samples with a diameter larger than a few microns. Further simulation studies have shown that optimization of the detector response curve and switching from a reflective X-ray target to a transmission target should allow us to reach sub-100-nm resolutions. |
| Starting Page | 157 |
| Ending Page | 160 |
| Page Count | 4 |
| File Format | PDF HTM / HTML |
| DOI | 10.1154/1.3416936 |
| Volume Number | 25 |
| Alternate Webpage(s) | http://www.icdd.com/resources/axa/vol53/V53_11.pdf |
| Alternate Webpage(s) | http://www.dxcicdd.com/09/PDF/Peter_Bruyndonckx.pdf |
| Alternate Webpage(s) | https://doi.org/10.1154/1.3416936 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |