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Deep Submicron CAD
| Content Provider | Semantic Scholar |
|---|---|
| Author | Baker, Keith |
| Copyright Year | 1997 |
| Abstract | As microstrip features scale into regimes of close to or below a tenth of a micron new metrics obtain importance beside the traditional area, time and power objectives. A decade of analysis has shown the increasing effect that interconnect is going to have, as VLSI systems are effectively transformed into microwave circuits of unprecedented complexity. Not only delay requires a totally new approach, future design systems have to be able to prevent detriments caused by crosstalk and resistive voltage drop in an essentially three-dimensional configuration. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www.cecs.uci.edu/~papers/compendium94-03/papers/1997/edt97/pdffiles/sess6a.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
