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A method for on-wafer experimental characterization of a 4-port circuit, using a 2-port vector network analyzer
| Content Provider | Semantic Scholar |
|---|---|
| Author | Simion, Stefan Marcelli, Romolo Sajin, Gheorghe Bartolucci, Giancarlo Craciunoiu, Florea |
| Copyright Year | 2009 |
| Abstract | The paper presents an experimental method useful to characterize on-wafer a four-port circuit, using a two-port VNA (Vector Network Analyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement. |
| Starting Page | 394 |
| Ending Page | 401 |
| Page Count | 8 |
| File Format | PDF HTM / HTML |
| Volume Number | 12 |
| Alternate Webpage(s) | http://www.imt.ro/romjist/Volum12/Number12_3/pdf/09-Simion%20S.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |