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Near-Field Imaging of Blue Semiconductors Using Scanning Near-Field Optical Microscopy Assisted by Second Harmonic Generation
| Content Provider | Semantic Scholar |
|---|---|
| Author | Okubo, Ryo |
| Copyright Year | 2014 |
| Abstract | Near-Field Imaging of Blue Semiconductors Using Scanning Near-Field Optical Microscopy Assisted by Second Harmonic Generation 山梨大院医工,上智大理工 ○大久保 領,三輪 嘉彦,高橋 良慈,酒井 優, 東海林 篤,内山 和治,小林 潔,松本 俊,岸野 克巳,堀 裕和 Univ. of Yamanashi, Sophia Univ., ○Ryo Okubo, Yoshihiko Miwa, Ryoji Takahashi, Masaru Sakai, Atsushi Syouji, Kazuharu Uchiyama, Kiyoshi Kobayashi, Takashi Matsumoto, Katsumi Kishino, and Hirokazu Hori E-mail: g13me007@yamanashi.ac.jp |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://confit.atlas.jp/guide/event-img/jsap2014a/18p-PB11-9/public/pdf?type=in |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |