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Polarization-Dependent X-ray Absorption Spectroscopy of La2CuO4Fx Thin Films Using Synchrotron Radiation
| Content Provider | Semantic Scholar |
|---|---|
| Author | Chen, Jer Ming Nachimuthu, Ponnusamy Edwards, Peter P. |
| Copyright Year | 2000 |
| Abstract | High-resolution polarization-dependent O K-edge x-ray absorption spectra for c-axis oriented La2CuO4Fx thin films were investigated. In the O 1s absorption edge of La2CuO4Fx, the prepeak at 528.7 eV is assigned to transitions into O 2pxy hole states located in the CuO2 planes. Fluoride ions present in La2CuO4Fx induce hole states in the CuO2 planes near the Fermi level, which in turn play an important role in enhancing superconductivity for this compound, as compared to parent La2CuO4. In La2CuO4Fx, fluoride ions are regarded as an electronic dopant to induce superconductivity |
| Starting Page | 231 |
| Ending Page | 236 |
| Page Count | 6 |
| File Format | PDF HTM / HTML |
| Volume Number | 38 |
| Alternate Webpage(s) | https://www.ch.ntu.edu.tw/~rsliu/publications/RSLiu-publication/(192).pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
