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A four-point surface conductivity probe suitable for in situ ultrahigh vacuum conductivity measurements
| Content Provider | Semantic Scholar |
|---|---|
| Author | Wiegenstein, Christopher G. Schulz, Kirk H. |
| Copyright Year | 1997 |
| Abstract | A simple design for a four-point probe suitable for precision surface conductivity measurements is described. Our design makes use of small, commercially available spring contact probes which are mounted in a custom built MACOR ceramic probe head. The design is suitable for use in ultrahigh vacuum applications, and the custom-built parts can be fabricated in any machine shop. Very reproducible values were obtained using this probe for surface conductivity measurements on a MoS2(0001) model catalyst, a sputter deposited indium-tin oxide thin film and a doped silicon wafer.A simple design for a four-point probe suitable for precision surface conductivity measurements is described. Our design makes use of small, commercially available spring contact probes which are mounted in a custom built MACOR ceramic probe head. The design is suitable for use in ultrahigh vacuum applications, and the custom-built parts can be fabricated in any machine shop. Very reproducible values were obtained using this probe for surface conductivity measurements on a MoS2(0001) model catalyst, a sputter deposited indium-tin oxide thin film and a doped silicon wafer. |
| Starting Page | 1812 |
| Ending Page | 1813 |
| Page Count | 2 |
| File Format | PDF HTM / HTML |
| DOI | 10.1063/1.1147968 |
| Volume Number | 68 |
| Alternate Webpage(s) | http://www.delta-technologies.com/downloads/bibliography.pdf?C=3 |
| Alternate Webpage(s) | https://doi.org/10.1063/1.1147968 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
