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Trajectory of Resonant Displacement of Thickness Vibration Mode Piezoelectric Devices According to Diameter/Thickness Ratio
Content Provider | Semantic Scholar |
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Author | Jeong, Yeong-Ho |
Copyright Year | 2012 |
Abstract | Department of Electrical Engineering, Chungju National University, Chungju 380-702, Korea(Received January 11, 2012; Revised January 17, 2012; Accepted January 20, 2012)Abstract: In this study, thickness vibration mode piezoelectric devices for AE sensor application were simulated using ATILA FEM program, and then fabricated. Trajectory resonant displacement and electro mechanical coupling factors of the piezoelectric devices were investigated. The simulation results showed that excellent displacement and electro mechanical coupling factor was obtained when the ratio of diameter/thickness(Ф/T) was 0.75. The piezoelectric device of Ф/T= 0.75 exhibited the optimum values of fr= 183 kHz, displacement= 4.44 × 10 |
Starting Page | 105 |
Ending Page | 109 |
Page Count | 5 |
File Format | PDF HTM / HTML |
DOI | 10.4313/JKEM.2012.25.2.105 |
Volume Number | 25 |
Alternate Webpage(s) | http://ocean.kisti.re.kr/downfile/volume/kieeme/JJJRCC/2012/v25n2/JJJRCC_2012_v25n2_105.pdf |
Alternate Webpage(s) | https://doi.org/10.4313/JKEM.2012.25.2.105 |
Language | English |
Access Restriction | Open |
Content Type | Text |
Resource Type | Article |