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Elastic Properties of Metallic Thin Films : 2 D Synchrotron Xrd Analysis during in Situ Tensile Testing
| Content Provider | Semantic Scholar |
|---|---|
| Author | Geandier, Guillaume Teat, Simon J. Goudeau, Philippe Bourhis, Eric Le |
| Copyright Year | 2008 |
| Abstract | Elastic behavior of thin films studied from in situ loading of the specimen during X-ray diffraction on a synchrotron source is presented. Model nanometric multilayer W/Au systems exhibiting different microstructures were analyzed. These films are supported by a (thin) polyimide substrate. X-ray diffraction in transmission geometry was used to study the deformations of both phases as a function of applied load. This geometry was developed with the aim of optimizing experiment time. Using 2D detectors and dynamical loading, measuring time is reduced considerably, down to a few hours compared to a one-week experiment in a laboratory. Furthermore, the in-plane strain state is measured in all directions with great precision. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www.icdd.com/resources/axa/VOL51/v51_24.pdf |
| Alternate Webpage(s) | http://www.icdd.com/resources/axa/vol51/v51_24.pdf |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | 3D film Biological specimen CDISC SEND Biospecimens Terminology Computed Tomography Scanning Systems Detectors Dynamical system Exhibits as Topic Experiment Gold Synchrotrons |
| Content Type | Text |
| Resource Type | Article |