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Strong anomalous optical dispersion of graphene: complex refractive index measured by Picometrology.
| Content Provider | Semantic Scholar |
|---|---|
| Author | Wang, Xuefeng Chen, Yong P. |
| Copyright Year | 2008 |
| Abstract | We introduce spinning-disc Picometrology which is designed to measure complex refractive index of ultra-thin and size-limited sample deposited on a solid surface. Picometrology is applied to measure the refractive index of graphene on thermal oxide on silicon. The refractive index varies from ñg = 2.4-1.0i at 532 nm to ñg = 3.0-1.4i at 633 nm at room temperature. The dispersion is five times stronger than bulk graphite (2.67- 1.34i to 2.73-1.42i from 532 nm to 633 nm). |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://arxiv.org/pdf/0811.1210.pdf |
| Alternate Webpage(s) | http://www.physics.purdue.edu/quantum/files/wang_dispersion_opexpress08.pdf |
| PubMed reference number | 19104646v1 |
| Volume Number | 16 |
| Issue Number | 26 |
| Journal | Optics express |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | Graphene Natural graphite Silicon |
| Content Type | Text |
| Resource Type | Article |
