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Rapid crystallization of silicon films using pulsed current-induced joule heating
| Content Provider | Semantic Scholar |
|---|---|
| Author | Sameshima, Toshiyuki Kaneko, Yusaku Andoh, Nobuyuki |
| Copyright Year | 2002 |
| Abstract | Abstract Crystallization of silicon films formed on glass substrates was achieved by rapid-joule heating of Cr strips adjacently formed via 200-nm-thick SiO 2 intermediate layers. 3-μs-pulsed voltages applied to the Cr strips caused a high joule heating intensity about 1×10 6 W / cm 2 . Transmission electron microscopy measurements confirmed a crystalline grain size of 50–100 nm. 1-μm-long crystalline grain growth was observed just beneath of the edge of Cr strips. The activation of phosphorus atoms according to crystallization was also achieved. |
| Starting Page | 746 |
| Ending Page | 750 |
| Page Count | 5 |
| File Format | PDF HTM / HTML |
| DOI | 10.1016/S0022-3093(01)01109-7 |
| Volume Number | 299302 |
| Alternate Webpage(s) | http://web.tuat.ac.jp/~sameken/publication/PDF/2002-2.pdf |
| Alternate Webpage(s) | https://doi.org/10.1016/S0022-3093%2801%2901109-7 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |