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Hole gas accumulation in Si/Ge core-shell and Si/Ge/Si core-double shell nanowires.
| Content Provider | Semantic Scholar |
|---|---|
| Author | Zhang, Xiao-Long Jevasuwan, Wipakorn Pradel, Ken C. Subramani, Thiyagu Takei, Toshiaki Fukata, Naoki |
| Copyright Year | 2018 |
| Abstract | Core-shell nanowires (NWs) composed of silicon and germanium can be used to realize high electron (hole) mobility transistors (HEMTs) by suppressing impurity scattering due to their band offset structure and selective doping. Boron doped p-type Si/intrinsic-Ge (i-Ge) core-shell NW structures are selected to study this phenomenon. To produce HEMT devices, hole gas accumulation must be controlled in the impurity undoped i-Ge shell layers. Spectral change in the Ge optical phonon is detected with increased B doping in p-Si core NWs, showing hole gas accumulation in this system. We also fabricate p-Si/i-Ge/p-Si core-double shell NWs to more clearly demonstrate hole gas accumulation in the i-Ge layers. |
| Starting Page | 21062 |
| Ending Page | 21068 |
| Page Count | 7 |
| File Format | PDF HTM / HTML |
| DOI | 10.1039/c8nr05590d |
| PubMed reference number | 30187068 |
| Journal | Medline |
| Volume Number | 10 |
| Issue Number | 45 |
| Alternate Webpage(s) | http://www.rsc.org/suppdata/c8/nr/c8nr05590d/c8nr05590d1.pdf |
| Alternate Webpage(s) | https://doi.org/10.1039/c8nr05590d |
| Journal | Nanoscale |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |