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MASTER 2 D magneto-optical trap as source for cold ions
| Content Provider | Semantic Scholar |
|---|---|
| Author | Kusters |
| Copyright Year | 2008 |
| Abstract | High brightness electron and ion beams find many applications in science and technology. In particular, ion beams are widely used by the semiconductor industry as high precision milling tools in so-called Focused Ion Beams (FIB). Due to the continuing demand to reduce the size of typical structures on semiconductor wafers, there is a need to improve the properties, such as the brightness, of ion sources. A new technique to produce electron and ion beams from ultra-cold plasmas has been developed recently. Such a plasma is created by near-threshold photo-ionization of a cloud of laser-cooled atoms that are trapped in a so-called Magneto-Optical Trap (MOT). In this thesis we present two related but separated investigations that aim to improve the properties of such a laser-cooled source. In the first part we improve an existing setup by adding an atomic beam source from which the MOT can be loaded. We experimentally investigate the conditions that optimize the source flux. We were able to increase the rate at which atoms are loaded into the trap by a factor of 10, to 5× 108 atoms/s. At the same time the trapping lifetime increased by a factor of 3, to 10 seconds. These improvements enables higher source brightness and extraction current. In the second part a new type of compact ultra-cold Rb+ ion source is proposed and its properties are investigated through numerical simulations. The source consists of an atomic beam extracted from a Knudsen-cell, which is then transversely cooled and compressed using a Magneto-Optical Compressor (MOC). We studied the performance of the source as function of several laser cooling parameters and find that we can obtain a reduced peak brightness of 4 × 108 A/sr m2 V at a current of 1.5 nA for a source temperature of 100oC. This new type of ion source can also be used with a light ions such as lithium for high resolution ion microscopy or with heavy ions as cesium for Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://pure.tue.nl/ws/files/46932518/759021-1.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
