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High strength and high electrical conductivity in bulk nanograined Cu embedded with nanoscale twins
| Content Provider | Semantic Scholar |
|---|---|
| Author | Zhang, Yong Li, Yuanyue Tao, Nairong |
| Copyright Year | 2007 |
| Abstract | A bulk nanograined Cu sample embedded with nanoscale twins is produced by means of dynamic plastic deformation at cryogenic temperatures. It exhibits a tensile yield strength of 610 MPa and an electrical conductivity of 95% IACS at room temperature. The unique combination of a high strength and a high conductivity is primarily attributed to the presence of a considerable amount of nanoscale twins which strengthen the material significantly while having a negligible influence on electrical conductivity. (C) 2007 American Institute of Physics. |
| Starting Page | 211901 |
| Ending Page | 211901 |
| Page Count | 1 |
| File Format | PDF HTM / HTML |
| DOI | 10.1063/1.2816126 |
| Alternate Webpage(s) | http://lu-group.imr.ac.cn/pdf/Zhang%20Y-APL(2007)211901.pdf |
| Alternate Webpage(s) | https://doi.org/10.1063/1.2816126 |
| Volume Number | 91 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |