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Standardless XRF analysis for LOI-rich rock samples by scatter fundamental parameter method
| Content Provider | Semantic Scholar |
|---|---|
| Author | Martin, Alexander Inoue, Hisashi Yamada, Yaujiro Kohno, Hisayuki |
| Copyright Year | 2005 |
| Abstract | X-ray fluorescence (XRF) spectrometry has been used for bulk rock analysis instead of AA and ICP due to easy sample preparation and the high precision capabilities. In addition, XRF is used as a screening tool prior to other analysis methods such as ICP-MS. In some cases it is difficult to prepare calibration samples because of availability. In this case a standardless analysis would be performed using a Fundamental Parameter (FP) routine. However, since the analysis results are usually calculated as a total concentration of 100% (normalized), components that are not analyzed, such as loss on ignition (LOI), would increase the analysis error. Therefore, it is necessary to obtain the values of these missing components for an accurate analysis. In order to accurately analyze LOI-rich samples without the pre-determination of an LOI content, scatter lines derived from the characteristic lines of the x-ray tube have been used. This estimation of the LOI content in standardless analysis has been combined with a fundamental parameter (FP) method. Using the Scatter FP Method in standardless analysis by XRF, it is possible to carry out accurate screening even for LOI-rich samples such as dolomite, limestone, clay and soil. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://goldschmidtabstracts.info/2005/796.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
