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ESD test for triple-junction solar cells with monolithic diode
| Content Provider | Semantic Scholar |
|---|---|
| Author | Nozaki, Yukishige Masui, Hirokazu Toyoda, Kazuhiro Cho, Mengu 野崎, 幸重 増井, 博一 豊田, 和弘 |
| Copyright Year | 2008 |
| Abstract | Recently many spacecraft use triple-junction (TJ) solar cells as their primary electrical power source because of their excellent efficiency. However it is also known that triple-junction solar cells are easy to be broken by a low reverse bias voltage. Therefore a discrete by-pass diode should be connected to every solar cell in parallel for the shadow protection. Under these circumstances, TJ solar cells with integrate monolithic diode (MD) have been introduced to market recently. In the CICing of TJ solar cell with MD, cell-to-cell interconnector is connected on MD pad. The interconnector region forms triple-junction in orbit, making primary arc inception easy. Therefore, it is necessary to study the behavior of arcs on MD solar cell array. The result of the ESD test for MD solar array revealed that the degradation of MD solar cell is caused by not only large current but also total energy of the discharge. The waveform seems to be affected by the impedance of the solar array circuit. This paper presents the recent results of ESD test for MD solar array and proposes further investigation based on the test results. 1. Triple Junction Solar Cell with Monolithic Diode Recently highly efficient triple junction solar cells are mostly used as the primary power source of spacecraft. The power density of the cell is almost double in comparison with crystal Silicon solar cell, a big benefit in the light of the weight and area of the solar array. However, triple junction solar cell is weaker than Silicon solar cell under the reverse bias condition. Therefore by-pass diode connected to each solar cell is required as its shadow protection. To add the by-pass diode to the TJ solar cell, a discrete Silicon diode is connected by the in-plane inter-connector. But recently TJ solar cell with integrated by-pass function has become available for space solar array. One monolithic diode is grown around the edge of the solar cell in this design and the solar array manufactures can reduce the welding of the inter-connector between by-pass diode and solar cell. Figure-1 shows the typical example of MD solar cell. Figure-1 Typical MD solar cell configuration 2. ESD test for MD solar cell array As shown in Figure-2, the discharges around the interconnector could be observed so often. But cell-tocell interconnector is usually connected on the MD pad for MD cell as shown in Figure-3. Therefore there is possibility that discharge may occur near or on MD. This is the reason why the ESD test for MD solar cell array was planed. Figure-2 Image of the typical discharge on solar array Figure-3 Cross-section of solar array panel Bypass Diode Cell to Cell Interconnector |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://repository.exst.jaxa.jp/dspace/bitstream/a-is/53460/1/63997013.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
