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Simultaneous Z-contrast/phase contrast imaging of ferroelectric thin films
| Content Provider | Semantic Scholar |
|---|---|
| Author | Chisholm, Matthew F. Lee, Ho Nyung Luo, Weidong Pantelides, Sokrates T. |
| Copyright Year | 2009 |
| Abstract | One less obvious result of aberration-correction in a scanning transmission electron microscope (STEM) was the improvement in bright field (BF) STEM imaging. It has long been understood that STEM BF imaging can be equivalent to TEM BF imaging via the principle of reciprocity [1], with the STEM probe-forming aperture equivalent to the TEM objective aperture and the STEM collector aperture equivalent to the TEM condenser aperture. However, the conditions necessary for coherent phase contrast imaging required that the STEM collector aperture had to be much smaller than the objective aperture. Thus, only a small fraction of the incident probe current could be used to form the image. As a result, STEM phase contrast images were extremely noisy and not often used. The situation is vastly improved after aberration correction. By reciprocity, the BF image is now equivalent to an aberration-corrected BF TEM image. The much larger flat-phase region produced by aberration correction allows the use of a collector aperture enlarged an order of magnitude without significant loss of coherence, giving two orders of magnitude increased signal. The resulting STEM BF image is now of high quality and is available simultaneously with the annular dark field image with pixel-to-pixel correlation. An example of the simultaneous phasecontrast and Z-contrast imaging of an <110> projection of a SrTiO3{111}/ Al2O3{001} interface is shown in Figure 1. The phase contrast images contain quantitative information on the composition of light columns such as oxygen, just as in aberration-corrected TEM [2,3]. |
| Starting Page | 1464 |
| Ending Page | 1465 |
| Page Count | 2 |
| File Format | PDF HTM / HTML |
| DOI | 10.1017/S1431927609097438 |
| Volume Number | 15 |
| Alternate Webpage(s) | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/EF067AD91D987DC6AAFEA779B1CB5D39/S1431927609097438a.pdf/div-class-title-simultaneous-z-contrast-phase-contrast-imaging-of-ferroelectric-thin-films-div.pdf |
| Alternate Webpage(s) | https://doi.org/10.1017/S1431927609097438 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
