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Effects of trimethylgallium flow rate on a-Plane GaN Growth on r-plane sapphire during one-sidewall-seeded epitaxial lateral overgrowth
| Content Provider | Semantic Scholar |
|---|---|
| Author | Hsu, Hsiao-Chiu Su, Yan-Kuin Huang, S. J. Chuang, Ricky W. Cheng, Shin-Hao Cheng, Chiao-Yang |
| Copyright Year | 2011 |
| Abstract | The high crystalline quality of a-plane GaN growth on r-plane sapphire has been demonstrated successfully by using one-sidewall-seeded epitaxial lateral overgrowth (OSELOG). The dislocation density of OSELOG-grown GaN film is 3–4 orders of magnitude lower than that of the as-grown film and the coalescence thickness of OSELOG-grown GaN is less than 5 µm. Low temperature cathodoluminescence (CL) shows that the optimum trimethylgallium (TMGa) flow rate during OSELOG plays a significant role in enhancing the crystalline quality of a-plane GaN. The crystalline quality of a-plane GaN can be effectively improved using OSELOG compared with the other ELOG approaches. |
| Starting Page | 035501 |
| Ending Page | 035501 |
| Page Count | 1 |
| File Format | PDF HTM / HTML |
| DOI | 10.1143/APEX.4.035501 |
| Alternate Webpage(s) | http://ir.lib.ksu.edu.tw/bitstream/987654321/17373/2/Effects%20of%20Trimethylgallium.pdf |
| Alternate Webpage(s) | https://doi.org/10.1143/APEX.4.035501 |
| Volume Number | 4 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |