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Boron Diffusion in TaSi2 Thin Films
| Content Provider | Scilit |
|---|---|
| Author | Marmelstein, R. Sinder, M. Pelleg, J. |
| Copyright Year | 1998 |
| Description | Journal: Physica Status Solidi (a) |
| Related Links | http://onlinelibrary.wiley.com/doi/10.1002/(SICI)1521-396X(199807)168:1<223::AID-PSSA223>3.0.CO;2-4/pdf |
| Ending Page | 229 |
| Page Count | 7 |
| Starting Page | 223 |
| ISSN | 00318965 |
| e-ISSN | 1521396X |
| DOI | 10.1002/%28sici%291521-396x%28199807%29168%3A1%3C223%3A%3Aaid-pssa223%3E3.3.co%3B2-w |
| Journal | Physica Status Solidi (a) |
| Issue Number | 1 |
| Volume Number | 168 |
| Language | English |
| Publisher | Wiley-Blackwell |
| Publisher Date | 1998-07-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Physica Status Solidi (a) Nuclear Energy and Engineering Boron Diffusion Mass Spectrometry Silicon Wafer Tasi2 Thin Thin Films |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials |