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Nonparametric tests for the gap time distributions of serial events based on censored data.
| Content Provider | Scilit |
|---|---|
| Author | Lin, D. Y. Ying, Zhiliang |
| Copyright Year | 2001 |
| Description | Journal: Biometrics |
| Related Links | http://onlinelibrary.wiley.com/doi/10.1111/j.0006-341X.2001.00369.x/pdf |
| Ending Page | 375 |
| Page Count | 7 |
| Starting Page | 369 |
| e-ISSN | 15410420 |
| DOI | 10.1111/j.0006-341x.2001.00369.x |
| Journal | Biometrics |
| Issue Number | 2 |
| Volume Number | 57 |
| Language | English |
| Publisher | Wiley-Blackwell |
| Publisher Date | 2001-06-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Biometrics Statistics and Probability Correlated Failure Times Dependent Censoring Kaplan–meier Estimator Log‐rank Statistic Multiple Events Recurrent Events Survival Analysis |
| Content Type | Text |
| Resource Type | Article |