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Silent Synapse Activation by Plasma‐Induced Oxygen Vacancies in TiO$ _{2}$ Nanowire‐Based Memristor
| Content Provider | Scilit |
|---|---|
| Author | Shan, Xuanyu Wang, Zhongqiang Lin, Ya Zeng, Tao Zhao, Xiaoning Xu, Haiyang Liu, Yichun |
| Copyright Year | 2020 |
| Description | Journal: Advanced Electronic Materials |
| Related Links | https://onlinelibrary.wiley.com/doi/pdf/10.1002/aelm.202000536 |
| ISSN | 2199160X |
| e-ISSN | 2199160X |
| DOI | 10.1002/aelm.202000536 |
| Journal | Advanced Electronic Materials |
| Issue Number | 9 |
| Volume Number | 6 |
| Language | English |
| Publisher | Wiley-Blackwell |
| Publisher Date | 2020-08-12 |
| Access Restriction | Open |
| Subject Keyword | Journal: Advanced Electronic Materials Ion Bombardment Oxygen Defects Schottky Barrier Silent Synapse Activation Trap‐assisted Tunneling |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials |