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Charakterisierung von Nanopartikeln in CMP-Slurries der Halbleiterindustrie
| Content Provider | Scilit |
|---|---|
| Author | Kuntzsch, T. Hollatz, M. Stintz, M. Ripperger, S. |
| Copyright Year | 2002 |
| Description | Journal: Chemie Ingenieur Technik |
| Ending Page | 551 |
| Starting Page | 550 |
| ISSN | 2573508X |
| e-ISSN | 15222640 |
| DOI | 10.1002/1522-2640%28200205%2974%3A5%3C550%3A%3Aaid-cite1111550%3E3.0.co%3B2-7 |
| Journal | Chemie Ingenieur Technik |
| Issue Number | 5 |
| Volume Number | 74 |
| Language | English |
| Publisher | Wiley-Blackwell |
| Publisher Date | 2002-05-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Chemie Ingenieur Technik |
| Content Type | Text |
| Resource Type | Article |
| Subject | Industrial and Manufacturing Engineering Chemistry Chemical Engineering |