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QUALITY IMPROVEMENT FOR RC06 CHIP RESISTOR
| Content Provider | Scilit |
|---|---|
| Author | Jeng, Yann-Chyn Guo, Shin-Ming |
| Copyright Year | 1996 |
| Description | Journal: Quality and Reliability Engineering International |
| Related Links | http://onlinelibrary.wiley.com/doi/10.1002/(SICI)1099-1638(199611)12:6<439::AID-QRE61>3.0.CO;2-0/pdf |
| Ending Page | 445 |
| Page Count | 7 |
| Starting Page | 439 |
| ISSN | 07488017 |
| e-ISSN | 10991638 |
| DOI | 10.1002/%28sici%291099-1638%28199611%2912%3A6%3C439%3A%3Aaid-qre61%3E3.0.co%3B2-0 |
| Journal | Quality and Reliability Engineering International |
| Issue Number | 6 |
| Volume Number | 12 |
| Language | English |
| Publisher | Wiley-Blackwell |
| Publisher Date | 1996-11-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Quality and Reliability Engineering International Cybernetical Science Categorical Data Taguchi Method Accumulation Analysis Scoring Scheme |
| Content Type | Text |
| Resource Type | Article |
| Subject | Management Science and Operations Research Safety, Risk, Reliability and Quality |