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Measurement of Insulator Surface Potential Using Time‐of‐flight Secondary Ion Mass Spectrometry
| Content Provider | Scilit |
|---|---|
| Author | Guo, X. Q. Short, R. T. |
| Copyright Year | 1996 |
| Description | Journal: Rapid Communications in Mass Spectrometry |
| Related Links | https://onlinelibrary.wiley.com/doi/pdf/10.1002/(SICI)1097-0231(199602)10:3<372::AID-RCM484>3.0.CO;2-2 |
| Ending Page | 376 |
| Page Count | 5 |
| Starting Page | 372 |
| e-ISSN | 10970231 |
| DOI | 10.1002/%28sici%291097-0231%28199602%2910%3A3%3C372%3A%3Aaid-rcm484%3E3.3.co%3B2-u |
| Journal | Rapid Communications in Mass Spectrometry |
| Issue Number | 3 |
| Volume Number | 10 |
| Language | English |
| Publisher | Wiley-Blackwell |
| Publisher Date | 1996-02-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Rapid Communications in Mass Spectrometry Emergency Medicine Surface Potential |
| Content Type | Text |
| Resource Type | Article |