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Bimodal failure behaviour of metal film resistors
| Content Provider | Scilit |
|---|---|
| Author | Croes, K. Ceuninck, W. De Schepper, L. De Tielemans, L. |
| Copyright Year | 1998 |
| Description | Journal: Quality and Reliability Engineering International |
| Related Links | http://onlinelibrary.wiley.com/doi/10.1002/(SICI)1099-1638(199803/04)14:2<87::AID-QRE166>3.0.CO;2-U/pdf |
| Ending Page | 90 |
| Page Count | 4 |
| Starting Page | 87 |
| ISSN | 07488017 |
| e-ISSN | 10991638 |
| DOI | 10.1002/%28sici%291099-1638%28199803/04%2914%3A2%3C87%3A%3Aaid-qre166%3E3.0.co%3B2-u |
| Journal | Quality and Reliability Engineering International |
| Issue Number | 2 |
| Volume Number | 14 |
| Language | English |
| Publisher | Wiley-Blackwell |
| Publisher Date | 1998-03-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Quality and Reliability Engineering International Characterization and Testing of Materials Metal Film Resistors Statistical Reliability Analysis Different Production Lots Ināsitu Electrical Measurements |
| Content Type | Text |
| Resource Type | Article |
| Subject | Management Science and Operations Research Safety, Risk, Reliability and Quality |