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"Ab initio" studies of hydrogen-enhanced oxygen diffusion in silicon
| Content Provider | Scilit |
|---|---|
| Author | Capaz, R. B. Assali, L. V. C. Kimerling, L. C. Cho, K. Joannopoulos, J. D. |
| Copyright Year | 1999 |
| Description | A novel microscopic mechanism for hydrogen-enhanced oxygen diffusion in p-doped silicon is proposed. A path for joint diffusion of O and H is obtained from an ab-initio molecular dynamics "kick" simulation. The migration pathway consists of a two-step mechanism, with a maximum energy of 1.46 eV. This path represents a 0.54 eV reduction in the static barrier when compared with the diffusion of isolated O in Si, in excellent agreement with experiments. |
| Related Links | http://www.scielo.br/pdf/bjp/v29n4/v29n4a01.pdf |
| Ending Page | 615 |
| Page Count | 5 |
| Starting Page | 611 |
| ISSN | 01039733 |
| e-ISSN | 16784448 |
| DOI | 10.1590/s0103-97331999000400002 |
| Journal | Brazilian Journal of Physics |
| Issue Number | 4 |
| Volume Number | 29 |
| Language | English |
| Publisher | FapUNIFESP (SciELO) |
| Publisher Date | 1999-12-01 |
| Access Restriction | Open |
| Subject Keyword | Brazilian Journal of Physics Applied Physics Ab Initio Diffusion in Silicon Hydrogen Enhanced Enhanced Oxygen Diffusion |
| Content Type | Text |
| Resource Type | Article |
| Subject | Physics and Astronomy |