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Bayesian and Dempster–Shafer reasoning for knowledge-based fault diagnosis–A comparative study
| Content Provider | Scilit |
|---|---|
| Author | Verbert, K. Babuška, R. Schutter, B. De |
| Copyright Year | 2017 |
| Description | Journal: Engineering Applications of Artificial Intelligence |
| Related Links | https://repository.tudelft.nl/islandora/object/uuid:7e099e57-34b9-4fd1-aadc-b1dacb661cee/datastream/OBJ/download |
| Ending Page | 150 |
| Page Count | 15 |
| Starting Page | 136 |
| ISSN | 09521976 |
| DOI | 10.1016/j.engappai.2017.01.011 |
| Journal | Engineering Applications of Artificial Intelligence |
| Volume Number | 60 |
| Language | English |
| Publisher | Elsevier BV |
| Publisher Date | 2017-04-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Engineering Applications of Artificial Intelligence Cybernetical Science Information Systems Decision Making Shafer Reasoning Based Fault Diagnosis Knowledge Based Fault |
| Content Type | Text |
| Resource Type | Article |
| Subject | Artificial Intelligence Control and Systems Engineering Electrical and Electronic Engineering |