NDLI: UA2TPG: An untestability analyzer and test pattern generator for SEUs in the configuration memory of SRAM-based FPGAs

Content Provider	Scilit
Author	Bernardeschi, Cinzia Cassano, Luca Domenici, Andrea Sterpone, Luca
Copyright Year	2016
Description	Journal: Integration
Related Links	https://arpi.unipi.it/bitstream/11568/790727/5/ivlsij16pp.pdf
Ending Page	97
Page Count	13
Starting Page	85
ISSN	01679260
DOI	10.1016/j.vlsi.2016.03.004
Journal	Integration
Volume Number	55
Language	English
Publisher	Elsevier BV
Publisher Date	2016-09-01
Access Restriction	Open
Subject Keyword	Journal: Integration Hardware and Architecture Single Event Upset Sram-based Fpga Untestability Analysis Model Checking
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture Software

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UA2TPG: An untestability analyzer and test pattern generator for SEUs in the configuration memory of SRAM-based FPGAs