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Growth characteristics of sputter-deposited thin films
| Content Provider | Scilit |
|---|---|
| Author | Huth, M. Reber, S. Heske, C. Schicketanz, P. Hessert, J. Gegenwart, P. Adrian, H. |
| Copyright Year | 1996 |
| Description | Journal: Journal of Physics: Condensed Matter Thin films of the heavy-fermion superconductor were deposited on various substrate materials in various orientations by means of a quasi-multilayer sputter process. Strongly (0001)-textured growth of the hexagonal compound was found for a uranium content in the range of 23% to 28% on sapphire and with perfect in-plane order on the latter substrate material. Atomic force microscopy and scanning electron microscopy revealed a Vollmer - Weber-like growth mode resulting in the development of large compressive strain in films on . As a result the electronic transport properties - in particular the temperature dependence of the resistivity - were strongly renormalized. Strong deviations from the typical heavy-fermion characteristics known from bulk samples were found in films on with residual resistance ratios up to 930 and a significantly reduced superconducting transition temperature of 130 mK. |
| Related Links | http://iopscience.iop.org/article/10.1088/0953-8984/8/45/013/pdf |
| Ending Page | 8786 |
| Page Count | 10 |
| Starting Page | 8777 |
| ISSN | 09538984 |
| e-ISSN | 1361648X |
| DOI | 10.1088/0953-8984/8/45/013 |
| Journal | Journal of Physics: Condensed Matter |
| Issue Number | 45 |
| Volume Number | 8 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1996-11-04 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics: Condensed Matter Condensed Matter Physics Electron Transport Atomic Force Microscopy Scanning Electron Microscopy |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Materials Science |
