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K-shell fluorescence yields of silicon and germanium by detector escapes
| Content Provider | Scilit |
|---|---|
| Author | Brunner, G. |
| Copyright Year | 1987 |
| Description | Journal: Journal of Physics B: Atomic and Molecular Physics Evaluating the K-shell fluorescence yield of an X-ray detector material like Si or Ge from the escape to parent peak ratio is essentially an integration problem; e.g., side wall effects make a contribution of the order of 1% for uncollimated beams. The transition from atomic X-ray fluorescence to detector emission is physically governed by relative absorption coefficients, and it is the uncertainty in these values which restricts the numerical reliability of the results: omega $K_{.Si}$=0.0481+or-0.0014 and omega $K_{,Ge}$=0.532+or-0.016. Both the values with their associated error limits are not sufficient to decide whether effects of the outer-shell configuration are numerically relevant. |
| Related Links | http://iopscience.iop.org/article/10.1088/0022-3700/20/19/011/pdf |
| Ending Page | 4991 |
| Page Count | 9 |
| Starting Page | 4983 |
| ISSN | 00223700 |
| DOI | 10.1088/0022-3700/20/19/011 |
| Journal | Journal of Physics B: Atomic and Molecular Physics |
| Issue Number | 19 |
| Volume Number | 20 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1987-10-14 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics B: Atomic and Molecular Physics Nuclear Physics X Ray Detector Absorption Coefficient X Ray Fluorescence |
| Content Type | Text |
| Resource Type | Article |
| Subject | Atomic and Molecular Physics, and Optics |
