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Variations in the resistivity of evaporated films of cadmium sulphide
| Content Provider | Scilit |
|---|---|
| Author | Buckley, R. W. Woods, J. |
| Copyright Year | 1973 |
| Description | Journal: Journal of Physics D: Applied Physics The way in which the resistivity of thin films of cadmium sulphide varies with thickness has been investigated. The films were deposited on glass substrates in a completely enclosed system using source temperatures of 800 and 850°C. It is shown that the variation in resistivity with thickness depends on the source temperature. The results are interpreted in terms of an increasing deviation from stoichiometry of the source as the evaporation proceeds. |
| Related Links | http://iopscience.iop.org/article/10.1088/0022-3727/6/9/312/pdf |
| Ending Page | 1089 |
| Page Count | 6 |
| Starting Page | 1084 |
| ISSN | 00223727 |
| e-ISSN | 13616463 |
| DOI | 10.1088/0022-3727/6/9/312 |
| Journal | Journal of Physics D: Applied Physics |
| Issue Number | 9 |
| Volume Number | 6 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1973-06-11 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics D: Applied Physics Condensed Matter Physics Thin Film |
| Content Type | Text |
| Resource Type | Article |
| Subject | Surfaces, Coatings and Films Acoustics and Ultrasonics Condensed Matter Physics Electronic, Optical and Magnetic Materials |