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Controlled nanometre-scale line and symbol formation on graphite in air using a scanning tunnelling microscope
| Content Provider | Scilit |
|---|---|
| Author | Roberts, C. J. Davies, Martyn Jackson, D. E. Tendler, S. J. B. Williams, Philip |
| Copyright Year | 1991 |
| Description | Journal: Journal of Physics: Condensed Matter The authors demonstrate the first reported production of etched lines on a highly oriented pyrolytic graphite surface using a scanning tunnelling microscope. This has been achieved by moving the imaging tip, biased at a minimum of 3.5 V of either polarity, in a controlled fashion over the substrate at a velocity of 10 nm $s^{-1}$ or greater. The potential of the technique to control the width and depth of the lines is investigated. The resultant etched structures may be used to evaluate the performance of the piezo-crystal tube and tip. The potential of this technique in the study of bio-molecules is noted. |
| Related Links | http://iopscience.iop.org/article/10.1088/0953-8984/3/37/014/pdf |
| Ending Page | 7216 |
| Page Count | 4 |
| Starting Page | 7213 |
| ISSN | 09538984 |
| e-ISSN | 1361648X |
| DOI | 10.1088/0953-8984/3/37/014 |
| Journal | Journal of Physics: Condensed Matter |
| Issue Number | 37 |
| Volume Number | 3 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1991-09-16 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics: Condensed Matter Microscopic Research Controlled Nanometre Scanning Tunnelling Tunnelling Microscope Evaluate the Performance |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Materials Science |