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Vapour density variations in a pulsed mercury discharge
| Content Provider | Scilit |
|---|---|
| Author | Airey, D. R. Swift, J. D. Gozna, C. F. |
| Copyright Year | 1972 |
| Description | Journal: Journal of Physics D: Applied Physics The vapour density in a low-pressure mercury-arc discharge has been measured under pulsed-arc conditions using a fast (similar 1 ms response time) ionization gauge. Three gauges were arranged at different distances from the cathode emission region, and their outputs recorded simultaneously on a multichannel oscilloscope together with the discharge current pulse. Examination of the oscillographic records showed that the vapour pulses were similar in form and amplitude with a rise of the form 1-cos θ and an approximately exponential decay, but with a delay dependent on the cathode-gauge distance. With background vapour pressures as low as 05 mTorr the vapour transit time is shown to follow a diffusion rather than a free-molecular flow mechanism consistent with a cathode spot temperature of about 800 K. Measurements of the amplitude of the vapour pulses indicate a vapour emission constant for the anchored mercury cathode of 0010 mg $C^{1}$. The decay time constant could be changed by varying the amount of condensation on the experimental tube walls. Values have been derived for the condensation coefficients of mercury vapour on both liquid mercury and glass surfaces under discharge tube surface conditions. |
| Related Links | http://iopscience.iop.org/article/10.1088/0022-3727/5/12/305/pdf |
| Ending Page | 2169 |
| Page Count | 9 |
| Starting Page | 2161 |
| ISSN | 00223727 |
| e-ISSN | 13616463 |
| DOI | 10.1088/0022-3727/5/12/305 |
| Journal | Journal of Physics D: Applied Physics |
| Issue Number | 12 |
| Volume Number | 5 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1972-12-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics D: Applied Physics |
| Content Type | Text |
| Resource Type | Article |
| Subject | Surfaces, Coatings and Films Acoustics and Ultrasonics Condensed Matter Physics Electronic, Optical and Magnetic Materials |