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Electrical measurement on a phthalocyanine Langmuir-Blodgett film: I. Comprehensive studies on the origins of scattering and drift of resistance values
| Content Provider | Scilit |
|---|---|
| Author | Pradeau, J. P. Perez, H. Armand, F. |
| Copyright Year | 1999 |
| Description | Journal: Journal of Physics D: Applied Physics The semi-conducting properties of an organic Langmuir-Blodgett (LB) film have been investigated using two configurations of LB film and electrodes. The studied material is the copper tetraoctadecyltetrapyridino [3,4-b : 3´,4´-g : 3´´,4´´-l : 3´´´,4´´´-q] porphyrazinium bromide (CuS18). The scattering of resistance values appears to be dependent on the configuration. Films in the `down' configuration (electrodes under the LB film) present resistance values that are less scattered but higher than the ones of films in the `top' configuration (electrodes over the LB film). The good but less reproducible contact which is observed in the `top' configuration is certainly provided by the penetration of gold atoms inside the organic film. Similarly, a study on the factors which influence the stability of organic/inorganic devices suggests that these factors originate from material structural evolution mainly near the shadow area of the electrodes. |
| Related Links | http://iopscience.iop.org/article/10.1088/0022-3727/32/9/303/pdf |
| Ending Page | 967 |
| Page Count | 7 |
| Starting Page | 961 |
| ISSN | 00223727 |
| e-ISSN | 13616463 |
| DOI | 10.1088/0022-3727/32/9/303 |
| Journal | Journal of Physics D: Applied Physics |
| Issue Number | 9 |
| Volume Number | 32 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1999-01-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics D: Applied Physics Langmuir Blodgett Film Langmuir Blodgett |
| Content Type | Text |
| Resource Type | Article |
| Subject | Surfaces, Coatings and Films Acoustics and Ultrasonics Condensed Matter Physics Electronic, Optical and Magnetic Materials |
