Loading...
Please wait, while we are loading the content...
Similar Documents
Adaptive pixel-to-pixel projection intensity adjustment for measuring a shiny surface using orthogonal color fringe pattern projection
| Content Provider | Scilit |
|---|---|
| Author | Chen, Chao Gao, Nan Wang, Xiangjun Zhang, Zonghua |
| Copyright Year | 2018 |
| Description | Journal: Measurement Science and Technology Three-dimensional (3D) shape measurement based on fringe pattern projection techniques has been commonly used in various fields. One of the remaining challenges in fringe pattern projection is that camera sensor saturation may occur if there is a large range of reflectivity variation across the surface that causes measurement errors. To overcome this problem, a novel fringe pattern projection method is proposed to avoid image saturation and maintain high-intensity modulation for measuring shiny surfaces by adaptively adjusting the pixel-to-pixel projection intensity according to the surface reflectivity. First, three sets of orthogonal color fringe patterns and a sequence of uniform gray-level patterns with different gray levels are projected onto a measured surface by a projector. The patterns are deformed with respect to the object surface and captured by a camera from a different viewpoint. Subsequently, the optimal projection intensity at each pixel is determined by fusing different gray levels and transforming the camera pixel coordinate system into the projector pixel coordinate system. Finally, the adapted fringe patterns are created and used for 3D shape measurement. Experimental results on a flat checkerboard and shiny objects demonstrate that the proposed method can measure shiny surfaces with high accuracy. |
| Related Links | http://iopscience.iop.org/article/10.1088/1361-6501/aab07a/pdf |
| ISSN | 09570233 |
| e-ISSN | 13616501 |
| DOI | 10.1088/1361-6501/aab07a |
| Journal | Measurement Science and Technology |
| Issue Number | 5 |
| Volume Number | 29 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2018-02-19 |
| Access Restriction | Open |
| Subject Keyword | Journal: Measurement Science and Technology Pixel Projection Intensity Shape Measurement |
| Content Type | Text |
| Resource Type | Article |
| Subject | Applied Mathematics Instrumentation Engineering |
