Loading...
Please wait, while we are loading the content...
Similar Documents
Aberration-corrected scanning transmission electron microscopy of semiconductors
| Content Provider | Scilit |
|---|---|
| Author | Krivanek, O. L. Dellby, N. Murfitt, M. F. |
| Copyright Year | 2011 |
| Description | Journal: Journal of Physics: Conference Series |
| Related Links | http://iopscience.iop.org/article/10.1088/1742-6596/326/1/012005/pdf |
| ISSN | 17426588 |
| e-ISSN | 17426596 |
| DOI | 10.1088/1742-6596/326/1/012005 |
| Journal | Journal of Physics: Conference Series |
| Volume Number | 326 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2011-11-09 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics: Conference Series Atmospheric Sciences Scanning Transmission Electron Microscopy Scanning Transmission Electron Microscope Electron Energy Loss Spectroscopy |
| Content Type | Text |
| Resource Type | Article |
| Subject | Physics and Astronomy |