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Investigation of crystallographic and detection properties of CdTe at the ANKA synchrotron light source
| Content Provider | Scilit |
|---|---|
| Author | Cecilia, A. Hamann, E. Haas, C. Greiffenberg, Dominic Danilewsky, A. Haenscke, D. Fauler, A. Zwerger, A. Buth, G. Vagovič, P. Baumbach, T. Fiederle, M. |
| Copyright Year | 2011 |
| Description | Journal: Journal of Instrumentation The crystallographic properties of a semiconducting CdTe pixelated sensor were investigated at the ANKA synchrotron facility (KIT, Karlsruhe) by means of back reflection white beam topography and high resolution X-ray diffraction. From the results, several orientation contrast features were identified that could be assigned to small angle grain boundaries of 0.01°. Those structures are disseminated in the whole area of the investigated crystal and form a mosaic structure network of tiled and twisted blocks. The topographic mapping of the sensor was correlated with its X-ray response map. The comparison demonstrates the presence of similar features, proving that the structural quality of the sensor material influences the charge carrier transport and consequently the detector performances. |
| Related Links | http://iopscience.iop.org/article/10.1088/1748-0221/6/10/P10016/pdf |
| Ending Page | P10016 |
| Page Count | 1 |
| Starting Page | P10016 |
| ISSN | 17480221 |
| e-ISSN | 17480221 |
| DOI | 10.1088/1748-0221/6/10/p10016 |
| Journal | Journal of Instrumentation |
| Issue Number | 10 |
| Volume Number | 6 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2011-10-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Instrumentation Characterization and Testing of Materials |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Mathematical Physics |
