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On the self-testing (m,n)-code checker design
| Content Provider | Scilit |
|---|---|
| Author | Butorina, N. Burkatovskaya, Yu Pakhomova, E. |
| Copyright Year | 2021 |
| Description | Journal: Iop Conference Series: Materials Science and Engineering We propose an approach to a self-testing (m, n)-code checker design, based on subdividing the set of all code words into special subsets called segments. The checker circuit is constructed by using one- and two-output configurable logic blocks (CLB). Previously, in each output of a CLB, a function representing exactly one segment was implemented. In the proposed approach, at each CLBs output, it is possible to implement functions that represent several segments and to provide the self-testing property. It allows reducing the number of CLBs and simplifying the circuit of the checker. |
| Related Links | https://iopscience.iop.org/article/10.1088/1757-899X/1019/1/012098/pdf |
| ISSN | 17578981 |
| e-ISSN | 1757899X |
| DOI | 10.1088/1757-899x/1019/1/012098 |
| Journal | Iop Conference Series: Materials Science and Engineering |
| Issue Number | 1 |
| Volume Number | 1019 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2021-01-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Iop Conference Series: Materials Science and Engineering Hardware and Architecture |
| Content Type | Text |
| Resource Type | Article |
