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Force and resolution analysis in Kelvin probe force microscopy using nanotube probes
| Content Provider | Scilit |
|---|---|
| Author | Xu, Jie Chen, Jianfeng Chen, Long Cai, Yuanlingyun Yu, Tianqi Li, Jinze |
| Copyright Year | 2019 |
| Description | Journal: Iop Conference Series: Materials Science and Engineering Multiple approaches have been exploited to improve the resolution and sensitivity of Kelvin probe force microscopy (KPFM), among which an apparent method is to use probes with sharp tip apex or with nanotube attached. In this paper, the electrostatic force in KPFM with nanotube probe was calculated by Green’s function theorem and boundary element method. Based on the force analysis, the sensitivity and resolution of KPFM using ordinary and nanotube probes were further quantitatively compared with each other. It was found that KPFM measurement with nanotube probe had a better resolution, however, the sensitivity deteriorated under air condition that might constrain its applications. |
| Related Links | https://iopscience.iop.org/article/10.1088/1757-899X/592/1/012036/pdf |
| ISSN | 17578981 |
| e-ISSN | 1757899X |
| DOI | 10.1088/1757-899x/592/1/012036 |
| Journal | Iop Conference Series: Materials Science and Engineering |
| Issue Number | 1 |
| Volume Number | 592 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2019-08-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Iop Conference Series: Materials Science and Engineering Microscopic Research Nanotube Probe Kelvin Probe Force Microscopy |
| Content Type | Text |
| Resource Type | Article |
