NDLI: Characterization of CdS films prepared by chemical-bath deposition

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Characterization of CdS films prepared by chemical-bath deposition

Content Provider	Scilit
Author	Rakhshani, A. E. Al-Azab, A. S.
Copyright Year	2000
Description	Journal: Journal of Physics: Condensed Matter Thin films of cadmium sulphide were deposited on glass substrates by the chemical bath deposition method. The results of measurements on the spectral response of photoconductivity, the optical absorption coefficient and the x-ray diffraction were used for the characterization of films. This study revealed that CdS films have tensile strain along the hexagonal (002) planes. The dependence of strain on the grain size is responsible for the variation of energy bandgap with the film thickness. Annealing in air, and at a temperature greater than 150 °C, relaxes the strain, reduces the extent of disorder in grain boundaries, reduces the energy bandgap and improves the mobility-lifetime product for photogenerated carriers.
Related Links	http://iopscience.iop.org/article/10.1088/0953-8984/12/40/316/pdf
Ending Page	8755
Page Count	11
Starting Page	8745
ISSN	09538984
e-ISSN	1361648X
DOI	10.1088/0953-8984/12/40/316
Journal	Journal of Physics: Condensed Matter
Issue Number	40
Volume Number	12
Language	English
Publisher	IOP Publishing
Publisher Date	2000-09-19
Access Restriction	Open
Subject Keyword	Journal: Journal of Physics: Condensed Matter Condensed Matter Physics Thin Film X Ray Diffraction Grain Size Grain Boundary
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Materials Science

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